Analysis of chemical and phase composition of copper oxide prepared by direct current sputtering for photovoltaic applications

This paper presents the application of X-ray fluorescence and X-ray diffraction methods for the study of copper oxide structures as an absorber layer in thin-film solar cells. The layers of copper oxide were applied by direct current magnetron sputtering. Quantitative and qualitative analysis of oxide layers were performed using XRF (X-ray fluorescence). The studies showed a high copper content in both samples, amounting to 98% and 96%, as well as trace amounts of other elements (nickel, lead). The XRD (X-ray diffraction) study showed Cu20 and Cu8O phases, amorphism ranging from 24% to 44%, and crystallinity from 55% to 75%. Crystallites of 30 nm were also determined. The aim of the study was to determine the chemical and phase composition of the layers obtained and to determine the degree of their contamination depending on the parameters of the manufacturing technology in terms of their application in photovoltaics. One of the samples showed an advantage both in terms of material and structural composition.

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Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2019).