Near electromagnetic field measurement of microprocessor

The article describe systematically the electromagnetic (EM) side channels sources and electromagnetic field of the microprocessor and is focused on the best way how to measure the near electromagnetic field of microprocessor. It was suggested and realized several electromagnetic probes and it was performed the measurement regarded to the theoretical background on the testbed with cryptographic module (microprocessor) performed the Advanced Encryption Standard (AES). On the measured waveforms of the electromagnetic emission was studied the influence of probe construction namely two parameters wire diameter and number of turns. In following measurement was studied how induced voltage depending on the distance of measuring coil to microprocessor and the last measurement dealt with position of probe and microchip.

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W artykule przedstawiono zagadnienie emisji pola elektromagnetycznego przez mikroprocesor i zawartych w nim informacji o stanie układu. Korzystając z platformy mikroprocesorowej, zaimplementowano AES i dokonano pomiarów sondami cewkowymi, badając zależność indukowanego napięcia od parametrów sondy (grubość drutu, ilość zwojów).