Measurement conditions of the quadratic electrooptic coefficients along the optic axis in uniaxial crystals

Following our previous discussions of measurement accuracy of electrooptic coefficients in uniaxial crystals the light wave propagation along the optic axis of ammonium dihydrogen phosphate (ADP) in a field that bisects the X and Y crystallographic axes is considered. We analyse the effect of imperfection in crystal cutting and alignment by means of computer analysis based on the Jones calculus. It is confirmed that, for relatively small inaccuracies, the values of the quadratic electrooptic coefficients can be significantly larger when measured with a static field than those measured with a sinusoidal one.