Computer controlled setup for thin film magnetoresistance measurements

The paper presents design and properties of the system for measuring of the magnetoresistance of multilayers and thin films. The measurement is automated using a computer with LabVIEW programming environment. labVIEW is a commercial high level praphical programming language that is designed for data acquisition and control. This paper discusses the applicability of LabVIEW in programming data acquisition systems in the physical experiments and demonstrates its utility in magnetoresistance measurements.