Determination of electrical and thermal parameters of vertical-cavity surface-emitting lasers

Experimental methods are presented for determining the thermal resistance of vertical-cavity surface-emitting lasers (VCSELs) and the lateral electrical conductivity of their p-type semiconductor layers. A VCSEL structure was manufactured from III-As compounds on a gallium arsenide substrate. Conductivity was determined using transmission line measurement (TLM). Electrical and thermal parameters were determined for various ambient temperatures. The results could be used for computer analysis of VCSELs.

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1. The authors would like to thank the National Centre for Research and Development for supporting research and development of VCSELs technology within the MAZOWSZE/0032/19-00 grant.

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2. Opracowanie rekordu ze środków MNiSW, umowa nr SONP/SP/546092/2022 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2024).