Method of research of photoelectric parameters of high impedance semiconductor films

The method of measuring the electrical conductivity and photoconductivity of semiconductor films with high electrical resistance is described. The developed computer program providing automation of measurements, as well as registration and initial processing of data is presented. The photoelectric properties of CdTe semiconductor films are investigated depending on technological factors of their obtaining. The activation energy of the mobility was determined and it was shown that for the films obtained on fresh cleavages of mica, this energy is less than twice that of films obtained on polished glass substrates.

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Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2019).