Phase, microstructure and microwave dielectric properties of Mg0:95Ni0:05 Ti0:98Zr0:02O3 ceramics

Mg0.95Ni0.05 Ti0.98Zr0.02O3 ceramics was prepared via conventional solid-state mixed-oxide route. The phase, microstructure and microwave dielectric properties of the sintered samples were characterized using X-ray diffraction (XRD), scanning electron microscopy (SEM) and a vector network analyzer. The microstructure comprised of circular and elongated plate-like grains. The semi quantitative analysis (EDS) of the circular and elongated grains revealed the existence of Mg0.95Ni0.05 T2O5 as a secondary phase along with the parent Mg0.95Ni0.05 Ti0.98Zr0.02O3r~17.1, Qufo~195855 ± 2550 GHz and tf ~ -46 ppm/K was achieved for the synthesized Mg0.95Ni0.05 Ti0.98Zr0.02O3 ceramics sintered at 1325 °C for 4 h.