A camera for scanning objects in motion based on an integrated detection system working in on-chip TDI mode

The paper presents an X-ray camera for testing moving objects. A typical application of such cameras is scanning products on an industrial production line. Currently, the most popular device detecting radiation in this type of camera consists of a pixel line based on scintillator detectors. Unfortunately, increasing its resolution automatically involves reducing the pixel size and reducing the signal-to-noise ratio. This is where the time domain integration method comes in handy, increasing the resolution without degrading the signal-to-noise ratio. The camera presented in this paper is based on an application-specific integrated circuit dedicated to this purpose. The application-specific integrated circuit core is a pixel matrix operating in a single-photon counting mode. Its architecture was designed to implement the time domain integration method and construct high-resolution cameras with a large scanning area. The article also describes the hardware and software of the application-specific integrated circuit readout system.

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1. Opracowanie rekordu ze środków MNiSW, umowa nr POPUL/SP/0154/2024/02 w ramach programu "Społeczna odpowiedzialność nauki II" - moduł: Popularyzacja nauki (2025).

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2. The work was created thanks to a project co-financed by the National Center for Research and Development under the “Path for Mazovia” program, contract: “MAZOWSZE/0099/19”.