Nanocrystallization of Bi2O3 based system from the glassy state under high compression

The result of Thermal Analysis and X-Ray Diffraction studies of bismuth trioxide (Bi2O3) based glass (Bi2O3-Al2O3-SiO2) after High-Presure (up to 1GPa) High-Temperature treatment and control sample measurements.

All files provided are in ASCII text with tab separated columns and header lines.

The names of the individual files correspond to the numbering of the figures in the paper: Aleksander Szpakiewicz-Szatan, Tomasz K. Pietrzak, Kacper Sierakowski, Michał Boćkowski, Sylwester J. Rzoska, Jerzy E. Garbarczyk, Szymon Starzonek, „Nanocrystallization of Bi2O3 based system from the glassy state under high compression”,  Materialia, Volume 33, 2024, 101975, ISSN 2589-159.

Files included in collection:

• Fig1.dat - Thermal Analysis scans in tested Bi2O3 systems, from at­mospheric pressure to P = 1GPa.
• Fig2.dat - DTA measurement of Bi2O3 based glass at ambient pressure (first two columns). XRD structure-related diagrams for the tested Bi2O3 based samples measured at selected temperatures and at at ambient pressure (in publication shown as insets in figure).
• Fig3.dat - XRD structures measured at ambient pressure and room temperature of materials after High-Pressure-High-Temperature treatment at selected pressures.
• Fig4.dat - Temperatures of observed phase transitions at various pressures.