Tytuł pozycji:
Graphene Schottky barrier diode acting as a semi-transparent contact to n-GaN
- Tytuł:
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Graphene Schottky barrier diode acting as a semi-transparent contact to n-GaN
- Autorzy:
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Kruszewski , Piotr
Sai, Pavlo
Krajewska, Aleksandra
Sakowski, Konrad
Ivonyak, Yurii
Jakieła, Rafał
Plesiewicz, Jerzy
Prystawko, Paweł
- Współwytwórcy:
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Kruszewski , Piotr
- Data publikacji:
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2024-07-15
- Wydawca:
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RepOD
- Tematy:
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Engineering
Physics
Graphene, gallium nitride, deep traps, defects, Deep Level Optical Spectroscopy, Steady State Photo Capacitance, Schottky barrier
- Dostawca treści:
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Repozytorium Otwartych Danych
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Przejdź do źródła  Link otwiera się w nowym oknie
The successful development of graphene Schottky barrier diodes (Gr SBDs) acting as an efficient semi-transparent contact to n-GaN has been demonstrated. Gr Schottky barrier diodes on n-GaN sample grown by the metal organic vapor phase (MOVPE) technique were fabricated and used in the measurements of steady-state photo-capacitance (SSPC) and deep level optical spectroscopy (DLOS), respectively. It is shown that SSPC and DLOS spectra obtained for Gr SBDs are in excellent agreement with Ni-based semi-transparent contacts to n-GaN used in this study for comparison. Additionally, the optical capture cross-section data (σ0) derived from DLOS were fitted using the Lucovsky model, under the assumption of no lattice relaxation for all deep traps observed in this study.
A set of raw experimental data that consists of:
- Raman spectra of CVD Graphene on GaN substrate.
- Capacitance-voltage traces and current-voltage characteristics for Ni/Au and Gr SBDs carried out at T = 293 K.
- Steady-state photo-capacitance (SSPC) spectra of the n-GaN samples with Ni/Au and Gr semi-transparent Schottky contacts.
- DLOS spectra corresponding to the SSPC data including Lucovsky model fitting.
- The voltage dependence of the ideality factor n in Gr/GaN and Ni/GaN SBDs.
- Density of states (Ds) vs Ec-E for Gr and Ni SBD.