Trapping Center Parameters in TlInS$\text{}_{2}$ Layered Crystals by Thermally Stimulated Current Measurements

Thermally stimulated current measure ments are carried out on TlInS$\text{}_{2}$ layered single crystal with the current flowing perpendicular to the c-axis in the temperature range of 10 to 90 K. The results are analyzed according to various methods, such as curve fitting, heating rate, and initial rise methods, which seem to be in good agreement with each other. Experimental evidence is found for one trapping center in TlInS$\text{}_{2}$ crystal in the low-temperature region.